Bibliografia
Principal
- Scanning probe microscopy, Ernst Meyer, Hans Josef Hug and Roland Bennewitz, Springer 2004. Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents, Adam Foster, Werner A. Hofer, Springer New York 2006 Scanning Probe Microscopy for Industrial Applications Nanomechanical Characterization, DALIA G. YABLON?, Wiley 2013 Scientific articles: